Microtextural analysis of grain fragmentation in aluminum

Materials Science Forum

Volumn 426-432, Issue 4, 2003, Pages 3739-3744

  Field, D P ^a   Wright, S I ^b   Trivedi, P ^a  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b EDAX TSL   (United States)

Author keywords

Aluminum; Dislocation structure; Electron backscatter diffraction (EBSD); Orientation gradient; Orientation imaging microscopy (OIM)

Indexed keywords

BACKSCATTERING; DEFORMATION; ELECTRON DIFFRACTION; GRAIN SIZE AND SHAPE; IMAGING TECHNIQUES; STATISTICAL METHODS; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY;

GRAIN FRAGMENTATION;

ALUMINUM;

EID: 0038266350     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.426-432.3739     Document Type: Conference Paper

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