Electronic characterization of Al/PMMA[poly(methyl methacrylate)]/p-Si and Al/CEP(cyanoethyl pullulan)/p-Si structures

Organic Electronics

Volumn 7, Issue 4, 2006, Pages 205-212

  Na, Moonkyong ^a   Rhee, Shi Woo ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Cyanoethyl pullulan; Organic thin film transistor; Poly(methyl methacrylate); Polymer gate dielectric

Indexed keywords

ALUMINUM; ANNEALING; CAPACITANCE; CURRENT VOLTAGE CHARACTERISTICS; DEPOSITION; ELECTRIC POTENTIAL; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; GLASS TRANSITION; HYSTERESIS; MISFET DEVICES; NATURAL FREQUENCIES; SILICON; SPIN COATING; SUBSTRATES; THIN FILMS;

CAPACITANCE-VOLTAGE BEHAVIOR; CYANOETHYL PULLULAN; FLAT BAND VOLTAGE; ORGANIC THIN FILM TRANSISTOR; POLYMER GATE DIELECTRIC;

POLYMETHYL METHACRYLATES;

EID: 33747475248     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2006.02.003     Document Type: Article

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