Amplitude and phase characterization of nonlinear mixing products

IEEE Transactions on Microwave Theory and Techniques

Volumn 54, Issue 8, 2006, Pages 3237-3245

  Pedro, José C ^a,b   Martins, João P ^a,b  

^a IEEE   (Portugal)

^b UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

Behavioral science; Nonlinear systems; Waveform analysis

Indexed keywords

BEHAVIORAL SCIENCE; PHASE CHARACTERIZATION; PHASE RELATIONS;

CORRELATION METHODS; MICROWAVES; NONLINEAR SYSTEMS; PHASE MEASUREMENT; WAVEFORM ANALYSIS;

AMPLITUDE MODULATION;

EID: 33747233094     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/TMTT.2006.879171     Document Type: Article

References (27)

1. N. Suematsu, Y. Iyama, and O. Ishida, "Transfer characteristics of IM3 relative phase for a GaAs FET amplifier," IEEE Trans. Microw. Theory Tech., vol. 45, no. 12, pp. 2509-2514, Dec. 1997.
2. Y. Tang, J. Yi, J. Nam, B. Kim, and M. Park, "Measurement of two-tone transfer characteristics of high-power amplifiers," IEEE Trans. Microw. Theory Tech., vol. 49, no. 3, pp. 568-571, Mar. 2001.
3. J. Vuolevi, T. Rahkonen, and J. Manninen, "Measurement technique for characterizing memory effects in RF power amplifiers," IEEE Trans. Microw. Theory Tech., vol. 49, no. 8, pp. 1383-1389, Aug. 2001.
4. J. Vuolevi and T. Rahkonen, Distortion in RF Power Amplifiers. Norwood, MA: Artech House, 2003.
5. J. Dunsmore and D. Goldberg, "Novel two-tone intermodulation phase measurement for evaluating amplifier memory effects," in 33rd Eur. Microw. Conf. Dig., Munich, Germany, Oct. 2003, pp. 235-238.
6. J. Martins and N. Carvalho, "Spectral filtering setup for uncorrelated multi-tone phase and amplitude measurement," in Proc. 34th Eur. Microw. Conf., Amsterdam, The Netherlands, Oct. 2004, pp. 201-204.
7. J. Martins and N. Carvalho, "Multitone phase and amplitude measurement for nonlinear device characterization," IEEE Trans. Microw. Theory Tech., vol. 53, no. 6, pp. 1982-1989, Jun. 2005.
8. H. Ku and J. Kenney, "Behavioral modeling of nonlinear RF power amplifiers considering memory effects," IEEE Trans. Microw. Theory Tech., vol. 51, no. 12, pp. 2495-2504, Dec. 2003.
9. J. Pedro, J. Martins, and P. Cabral, "New method for phase characterization of nonlinear distortion products," in IEEE MTT-S Int. Microw. Symp. Dig., Long Beach, CA, Jun. 2005, pp. 971-974.
10. K. Remley, D. Schreurs, D. Williams, and J. Wood, "Extended NVNA bandwidth for long-term memory measurements," in IEEE MTT-S Int. Microw. Symp. Dig., Fort Worth, TX, Jun. 2004, pp. 1739-1742.
11. _, "Simplifying and interpreting two-tone measurements," IEEE Trans. Microw. Theory Tech., vol. 52, no. 11, pp. 2576-2584, Nov. 2004.
12. K. Remley, D. Williams, D. Schreurs, G. Loglio, and A. Cidronali, "Phase detrending for measured multisine signals," in 61st ARFTG Conf. Dig., Philadelphia, PA, Jun. 2003, pp. 73-83.
13. J. Pedro and N. Carvalho, Intermodulation Distortion in Microwave and Wireless Circuits. Norwood, MA: Artech House, 2003.
14. J. Pedro and N. Carvalho, "On the use of multi-tone techniques for assessing RF components' intermodulation distortion," IEEE Trans. Microw. Theory Tech., vol. 47, no. 12, pp. 2393-2402, Dec. 1999.
15. J. C. Pedro and N. B. Carvalho, "Characterizing nonlinear RF circuits for their in-band signal distortion," IEEE Trans. Instrum. Meas., vol. 51, no. 6, pp. 420-426, Jun. 2002.
16. G. Loglio, J. Jargon, and D. DeGroot, "Phasor angle definition suitable for intermodulation measurements," in 65th ARFTG Conf. Dig., Long Beach, CA, Jun. 2005, pp. 83-89.
17. A. Zhu, M. Wren, and T. Brazil, "An efficient Volterra-based behavioral model for wideband RF power amplifiers," in IEEE MTT-S Int. Microw. Symp. Dig, Philadelphia, PA, Jun. 2003, pp. 787-790.
18. C. Silva, "Time-domain measurement and modeling techniques for wideband communication components and systems," Int. J. RF Microw. Comput.-Aided Eng., vol. 13, pp. 5-31, Jan. 2003.
19. C. Silva, A. Moulthrop, and M. Muha, "Introduction to polyspectral modeling and compensation techniques for wideband communications systems," in 58th ARFTG Conf. Dig., San Diego, CA, Nov. 2001, pp. 1-15.
20. "Microwave Transition Analyzer User's Guide," Agilent Technol., Palo Alto, CA, Nov. 1992.
21. S. Boyd and L. Chua, "Fading memory and the problem of approximating nonlinear operators with Volterra series," IEEE Trans. Circuits Syst., vol. CAS-32, no. 11, pp. 1150-1161, Nov. 1985.
22. S. A. Maas, Nonlinear RF and Microwave Circuits. Norwood, MA: Artech House, 2003.
23. J. Schouckens and R. Pintelon, System Identification - A Frequency Domain Approach. Piscataway, NJ: IEEE Press, 2001.
24. A. Gelb and W. Vander Velde, Multiple-Input Describing Functions and Nonlinear System Design. New York: McGraw-Hill, 1968.
25. J. Bendat and A. Piersol, Engineering Applications of Correlation and Spectral Analysis. New York: Wiley, 1993.
26. S. Boyd, Y. Tang, and L. Chua, "Measuring Volterra kernels," IEEE Trans. Circuits Syst., vol. CAS-30, no. 8, pp. 571-577, Aug. 1983.
27. L. Chua and Y. Liao, "Measuring Volterra kernels - II," Int. J. Circuit Theory Applicat., vol. 17, pp. 151-190, Apr. 1989.