Morphological differences between Bi, Ag and Sb nano-particles and how they affect the percolation of current through nano-particle networks

European Physical Journal D

Volumn 39, Issue 3, 2006, Pages 415-422

  Dunbar, A D F ^a,b   Partridge, J G ^a   Schulze, M ^a   Brown, S A ^a  

^a UNIVERSITY OF CANTERBURY   (New Zealand)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

INERT GASES; NANOPARTICLES; SCANNING ELECTRON MICROSCOPY; SILICON NITRIDE; SOLVENTS; SURFACE DEFECTS;

'CURRENT; ATOMIC-FORCE-MICROSCOPY; DOME SHAPES; ELECTRICAL CONTACTS; GAS AGGREGATION; NANOPARTI-CLES; PARTICLE NETWORK; RANDOM DISTRIBUTION; SIN SURFACES; SPHERICAL SHAPE;

ATOMIC FORCE MICROSCOPY;

EID: 33746926788     PISSN: 14346060     EISSN: 14346079     Source Type: Journal    
DOI: 10.1140/epjd/e2006-00113-4     Document Type: Article

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