Finite-size effects in the conductivity of cluster assembled nanostructures

Physical Review Letters

Volumn 88, Issue 22, 2002, Pages 226802/1-226802/4

  Schmelzer, J ^a,b   Brown, S A ^a   Wurl, A ^a   Hyslop, M ^a   Blaikie, R J ^a  

^a UNIVERSITY OF CANTERBURY   (New Zealand)

^b UNIVERSITY OF ROSTOCK   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; ELECTRIC CONDUCTIVITY; ELECTRIC CONTACTS; ELECTRIC CURRENTS; ELECTRON BEAM LITHOGRAPHY; FIELD EFFECT TRANSISTORS; PHOTOLITHOGRAPHY; PROBABILITY; RANDOM PROCESSES; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS;

CLUSTER ASSEMBLED NANOSTRUCTURES; FINITE SIZE EFFECTS; PERCOLATION THEORY;

NANOTECHNOLOGY;

EID: 0037014071     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.88.226802     Document Type: Article

References (26)