An exact solution to the minimum size test pattern problem

ACM Transactions on Design Automation of Electronic Systems

Volumn 6, Issue 4, 2001, Pages 629-644

  Flores, Paulo F ^a   Neto, Horácio C ^a   Marques Silva, João P ^a  

^a UNIVERSITY OF LISBON   (Portugal)

Author keywords

Algorithms; Automatic test pattern generation (ATPG); Built in self test (BIST); Integer linear programming (ILP); Propositional satisfiability (SAT); Reliability; Verification and test

Indexed keywords

EID: 33746845358     PISSN: 10844309     EISSN: None     Source Type: Journal    
DOI: 10.1145/502175.502186     Document Type: Article

References (24)

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