Test width compression for built-in self testing

IEEE International Test Conference (TC)

Volumn , Issue , 1997, Pages 328-337

  Chakrabarty, Krishnendu ^a   Murray, Brian T ^a   Liu, Jian ^a   Zhu, Minyao ^a  

^a BOSTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COUNTING CIRCUITS; DIGITAL CIRCUITS;

BUILT IN SELF TEST (BIST); DECOMPRESSION CIRCUITS; TEST GENERATOR CIRCUITS (TGC); WIDTH COMPRESSION TESTING;

INTEGRATED CIRCUIT TESTING;

EID: 0031344746     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (26)