Selective excision of C5 from D-ribose in the gas phase by low-energy electrons (0-1 eV): Implications for the mechanism of DNA damage

Angewandte Chemie - International Edition

Volumn 45, Issue 29, 2006, Pages 4851-4855

  Bald, Ilko ^a   Kopyra, Janina ^a,b   Illenberger, Eugen ^a  

^a FREIE UNIVERSITÄT BERLIN   (Germany)

^b SIEDLCE UNIVERSITY OF NATURAL SCIENCES AND HUMANITIES   (Poland)

Author keywords

Bioorganic chemistry; Dissociative electron attachment; DNA damage; Gas phase reactions; Negative ion mass spectrometry

Indexed keywords

BIOORGANIC CHEMISTRY; DISSOCIATIVE ELECTRON ATTACHMENT; DNA DAMAGE; GAS-PHASE REACTIONS; NEGATIVE ION MASS SPECTROMETRY;

DEGRADATION; DNA; REACTION KINETICS; SUGARS;

ELECTRONS;

DNA; ION; RIBOSE;

ARTICLE; CHEMICAL STRUCTURE; CHEMISTRY; DNA DAMAGE; ELECTRON; GAS; GENETICS; HEAT;

DNA; DNA DAMAGE; ELECTRONS; GASES; HEAT; HOT TEMPERATURE; IONS; MOLECULAR STRUCTURE; RIBOSE;

EID: 33746806654     PISSN: 14337851     EISSN: None     Source Type: Journal    
DOI: 10.1002/anie.200600303     Document Type: Article

References (28)

1. V. Cobut, Y. Fongillo, J. P. Patau, T. Goulet, M.-J. Fraser, J.-P. Jay-Gerin, Radiat. Phys. Chem. 1998, 51, 229.
2. L. Sanche, Eur. Phys. J. D 2005, 35, 367 (Review).
3. B. Boudaiffa, P. Cloutier, D. Hunting, M. A. Huels, L. Sanche, Science 2000, 287, 1658.
4. F. Martin, P. D. Burrow, Z. Cai, P. Cloutier, D. J. Hunting, L. Sanche, Phys. Rev. Lett. 2004, 93, 068101.
5. G. Hanel, B. Gstir, P. S. Denifl, P. Scheier, B. Farizon, M. Farizon, E. Illenberger, T. D. Märk, Phys. Rev. Lett. 2003, 90, 188104.
6. S. Ptasinska, S. Denifl, V. Grill, P. Scheier, T. D. Märk, S. Gohlke, M. A. Huels, E. Illenberger, Angew. Chem. 2005, 117, 1673;
7. Angew. Chem. Int. Ed. 2005, 44, 1647.
8. S. Ptasinska, S. Denifl, E. Illenberger, P. Scheier, T. D. Märk, Phys. Rev. Lett. 2005, 95, 093201.
9. H. Abdoul-Carime, S. Gohlke, E. Illenberger, Phys. Rev. Lett. 2004, 92, 168103.
10. S. Ptasinska, S. Denifl, P. Scheier, E. Illenberger, T. D. Märk, Angew. Chem. 2005, 117, 7101;
11. Angew. Chem. Int. Ed. 2005, 44, 6941.
12. R. Abouaf, H. Dunet, Eur. Phys. J. D 2005, 35, 405.
13. A. M. Scheer, K. Aflatooni, G. A. Gallup, P. D. Burrow, Phys. Rev. Lett. 2004, 92, 068102.
14. J. Berdys, I. Anusiewicz, P. Skurski, J. Simons, J. Am. Chem. Soc. 2004, 126, 6441.
15. S. Ptasinska, S. Denifl, P. Scheier, T. D. Märk, S. Gohlke, E. Illenberger, Angew. Chem. 2006, 118, 1926;
16. Angew. Chem. Int. Ed. 2006, 45, 1893.
17. S. Ptasinska, S. Denifl, P. Scheier, T. D. Märk, J. Chem. Phys. 2004, 120, 8505.
18. R. Balog, J. Langer, S. Gohlke, M. Stano, H. Abdoul-Carime, E. Illenberger, Int. J. Mass Spectrom. 2004, 233, 267.
19. A. Stamatovic, G. J. Schulz, Rev. Sci. Instrum. 1970, 41, 423.
20. L.-P. Guler, Y.-Q. Yu, H. I. Kenttamäa, J. Phys. Chem. A 2002, 106, 6754.
21. P. Sulzer et al., J. Chem. Phys., submitted.
22. NIST Chemistry webbok: http://webbook.nist.gov/chemistry.
23. I. Martin, T. Skalicky, J. Langer, H. Abdoul-Carime, G. Karwasz, E. Illenberger, M. Stano, S. Matejcik, Phys. Chem. Chem. Phys. 2005, 7, 2212.
24. W. Sailer, A. Pelc, M. Probst, J. Limtrakul, P. Scheier, E. Illenberger, T. D. Märk, Chem. Phys. Lett. 2003, 378, 250.
25. A. Pelc, W. Sailer, P. Scheier, T. D. Märk, E. Illenberger, Chem. Phys. Lett. 2004, 392, 465.
26. C. König, J. Kopyra, I. Bald, E. Illenberger, Phys. Rev. Lett., accepted.
27. L. G. Christophorou, J. K. Olthoff, J. Phys. Chem. Ref. Data 2000, 29, 267.
28. L. G. Christophorou, J. K. Olthoff, Fundamental Electron Interactions with Plasma Processing Gases, Kluwer Academic/Plenum Publishers, New York, 2004.