Fast wavelength-scanning interferometry technique with derivative detection of quadrature signals

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6188, Issue , 2006, Pages

  Cip O ^a   Mikel, B ^a   Lazar, J ^a  

^a INSTITUTE OF SCIENTIFIC INSTRUMENTS   (Czech Republic)

Author keywords

Absolute interferometry; Tunable laser; Wavelength scanning interferometry

Indexed keywords

CONTROL EQUIPMENT; FABRY-PEROT INTERFEROMETERS; INTERFEROMETRY; MODULATION; PHOTODETECTORS; TUNING;

ABSOLUTE INTERFEROMETRY; TUNABLE LASER; WAVELENGTH-SCANNING INTERFEROMETRY;

NANOTECHNOLOGY;

EID: 33746696081     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.663129     Document Type: Conference Paper

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