Thermal diffusion of Co into atomically flat ZnO(000-1) surfaces investigated by scanning probe microscopies and low energy electron diffraction

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 24, Issue 4, 2006, Pages 2124-2131

  Dumont, J ^a   Seldrum, T ^a   Couet, S ^a   Moisson, C ^b   Turover, D ^b   Sporken, R ^a  

^a UNIVERSITY OF NAMUR   (Belgium)

^b SAVOIE TECHNOLAC   (France)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; CHEMICAL CLEANING; IMPURITIES; LOW ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SPUTTERING; THERMAL DIFFUSION; ULTRAHIGH VACUUM; ZINC OXIDE;

ATOMICALLY FLAT SURFACES; EX SITU CHEMICAL CLEANING; FLUID LAYERS; SCANNING PROBE MICROSCOPIES;

COBALT;

EID: 33746626529     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2216716     Document Type: Article

References (24)

1. G. Schmidt, D. Ferrand, L. W. Molenkamp, A. T. Filip, and B. J. van Wees, Phys. Rev. B 62, R4790 (2000).
2. J. Xu, Q. Fan, Y. Shun, and Z. Tian, Sens. Actuators B 66, 277 (2000).
3. E. Traversa and A. Bearzotti, Sens. Actuators B 23, 181 (1995).
4. L. F. Dong, Z. L. Cui, and Z. K. Zhang, Nanostruct. Mater. 8, 815 (1997).
5. M. S. Castro and C. M. Aldao, J. Eur. Ceram. Soc. 19, 511 (1999).
6. S. Jiang, H. Zhang, Y. Huang, M. Liu, and R. Lin, Mater. Sei. Eng., B 117, 317 (2005).
7. S. J. Pearton, C. R. Abernathy, D. P. Norton, A. F. Hebard, Y. D. Park, L. A. Boatner, and T. D. Budai, Mater. Sei. Eng., R. 40, 137 (2003).
8. N. A. Theodoropoulou et al.. Solid-State Electron. 47, 2231 (2003).
9. G. Kresse, O. Dulub, and U. Diebold, Phys. Rev. B 68, 245409 (2003).
10. M. Kunat, S. Girol, T. Becker, U. Burghaus, and C. Wöll, Phys. Rev. B 66, 81402 (2002).
11. W. Gaebler, K. Jacobi, and W. Ranke, Surf. Sci. 75. 355 (1978).
12. O. Dulub, L. A. Boatner, and U. Diebold, Surf. Sci. 504, 271 (2002).
13. K. H. Ernst, A. Ludviksson, R. Zhang, J. Yoshihara, and C. T. Campbell, Phys. Rev. B 47, 13782 (1993).
14. A. N. Mariano and R. E. Hanneman, J. Appl. Phys. 34, 384 (1963).
15. J. Fryar, E. Mcglynn, M. O. Henry, A. A. Cafolla, and C. J. Hanson, Nanotechnology 15, l (2004).
16. H. A. Storms, K. F. Brown, and J. D. Stein, Anal. Chem. 49, 2023 (1977).
17. M. J. VelleKoop, C. C. G. Visser, P. M. Sarro, and A. Venema, Sens. Actuators, A 21, 1027 (1990).
18. J. Fryar, E. McGlynn, M. O. Henry, A. A. Cafolla. and C. J. Hanson, Physica B 340-342, 201 (2003).
19. C. M. Mate and V. J. Novotny, J. Chem. Phys. 94, 8420 (1991).
20. O. Dulub, L. A. Boatner, and U. Diebold, Surf. Sci. 519, 201 (2002).
21. T. M. Parker, N. G. Condon, R. Lindsay, R M. Leibsle. and G. Thornton, Surf. Sci. 415, L1046 (1998).
22. O. Dulub, U. Diebold, and G. Kresse, Phys. Rev. Lett. 90, 016102 (2003).
23. Y. Shao, W. Chen, E. Wold, and J. Paul, Langmuir 10, 178 (1994).
24. V. Podgursky, I. Costina, and R. Franchy, Surf. Sci. 529, 419 (2003).