Analysis of the injection layer of PTCDA in OLEDs using x-ray photoemission spectroscopy and atomic force microscopy

Chinese Physics

Volumn 15, Issue 6, 2006, Pages 1296-1300

  Ou, Gu Ping ^a,b   Song, Zhen ^c   Wu, You Yu ^a   Chen, Xiao Qiang ^a   Zhang, Fu Jia ^a  

^a LANZHOU UNIVERSITY   (China)

^b HUNAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^c BEIJING INSTITUTE OF MACHINERY   (China)

Author keywords

Atomic force microscopy; PTCDA ITO; X ray photoemission spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; HOLE TRAPS; INTERFACES (MATERIALS); LIGHT EMITTING DIODES; SEMICONDUCTING INDIUM COMPOUNDS; SURFACE TREATMENT; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL CONSTITUENTS; ORGANIC LIGHT EMITTING DIODES (OLED); PERYLENETETRACARBOXYLIC DIANHYDRIDE/INDIUM-TIN-OXIDE (PTCDA/ITO); SAMPLE SURFACES;

ATOMIC PHYSICS;

EID: 33746613333     PISSN: 10091963     EISSN: 17414199     Source Type: Journal    
DOI: 10.1088/1009-1963/15/6/027     Document Type: Article

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