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Volumn 54, Issue 12, 2005, Pages 5717-5722
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Surface analysis of LiBq4/ITO and LiBq4/CuPc/ITO using atomic force microscopy and x-ray photoelectron spectroscopy
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Author keywords
Atomic force microscopy; Electron affinity; X ray photoelectron spectroscopy
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Indexed keywords
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EID: 30044447550
PISSN: 10003290
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (29)
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