Analysis of the local structure of AlN:Mn using X-ray absorption fine structure measurements

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 3, Issue , 2006, Pages 1742-1745

  Miyajima, Takao ^a   Kudo, Yoshihiro ^a   Uruga, Tomoya ^b   Hara, Kazuhiko ^c  

^a SONY CORPORATION   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^c SHIZUOKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

D-ELECTRONS; MN ATOMS; REDORANGE LUMINESCENCE; X-RAY ABSORPTION FINE STRUCTURE (XAFS) MEASUREMENTS; 61.10.HT; 61.72.VV; 71.55.EQ; 78.55.CR; LATTICE SITES; LOCAL STRUCTURE; ROOM TEMPERATURE; X RAY ABSORPTION FINE STRUCTURES;

CRYSTAL STRUCTURE; METALLORGANIC CHEMICAL VAPOR DEPOSITION; PHASE TRANSITIONS; PHOTOLUMINESCENCE; X RAY ANALYSIS; X RAY ABSORPTION;

ALUMINUM NITRIDE; MANGANESE;

EID: 33746354310     PISSN: 18626351     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssc.200565393     Document Type: Conference Paper

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