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Volumn 3, Issue , 2006, Pages 1667-1670
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Quantitative strain analysis of GaN/AIN quantum dot multilayers
a
CEA GRENOBLE
(France)
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM NITRIDE;
FOURIER TRANSFORMS;
GALLIUM NITRIDE;
GREEN'S FUNCTION;
MULTILAYERS;
SEMICONDUCTOR QUANTUM DOTS;
TRANSMISSION ELECTRON MICROSCOPY;
ALN SPACERS;
GEOMETRICAL PHASE ANALYSIS;
STRAIN ANALYSIS;
VERTICAL ALIGNMENT;
68.35.GY;
68.37.LP;
68.65.HB;
83.85.ST;
GREEN'S FUNCTION TECHNIQUE;
MULTILAYER STRUCTURES;
THEORETICAL CALCULATIONS;
STRAIN MEASUREMENT;
MULTILAYERS;
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EID: 33746348640
PISSN: 18626351
EISSN: None
Source Type: Journal
DOI: 10.1002/pssc.200565301 Document Type: Conference Paper |
Times cited : (3)
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References (14)
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