Orientation dependent ferroelectric properties in samarium doped bismuth titanate thin films grown by the pulsed-laser-ablation method

Applied Physics Letters

Volumn 89, Issue 3, 2006, Pages

  Cheng, Zhenxiang ^a,b   Kannan, Chinna Venkatasamy ^a   Ozawa, Kiyoshi ^a   Kimura, Hideo ^a   Wang, Xiaolin ^b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b UNIVERSITY OF WOLLONGONG   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

BISMUTH COMPOUNDS; CRYSTAL ORIENTATION; FERROELECTRICITY; FILM GROWTH; LASER ABLATION; LASER PULSES; SAMARIUM; SEMICONDUCTOR DOPING; SOL-GELS;

BISMUTH TITANATE; FERROELECTRIC PROPERTIES; REMANENT POLARIZATION;

THIN FILMS;

EID: 33746289257     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2221918     Document Type: Article

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