Simulation studies of two-layer hopfield neural networks for automatic wafer defect inspection

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 4031 LNAI, Issue , 2006, Pages 1119-1126

  Chang, Chuan Yu ^a   Wang, Hung Jen ^a   Lin, Si Yan ^a  

^a NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER ARCHITECTURE; COMPUTER SIMULATION; DEFECTS; SCANNING ELECTRON MICROSCOPY;

HOPFIELD NEURAL NETWORKS; SCANNING ELECTRON MICROSCOPES; SPATIAL INFORMATION; WAFERS;

NEURAL NETWORKS;

EID: 33746215631     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/11779568_119     Document Type: Conference Paper

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