Remaining life prediction of thermal barrier coatings based on photoluminescence piezospectroscopy measurements

Journal of Engineering for Gas Turbines and Power

Volumn 128, Issue 3, 2006, Pages 610-616

  Wen, Mei ^a   Jordan, Eric H ^a   Gell, Maurice ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

LIFE CYCLE; NEURAL NETWORKS; PHOTOLUMINESCENCE; REGRESSION ANALYSIS; SPECTROSCOPY;

MAXIMUM ABSOLUTE ERROR; PHOTOLUMINESCENCE PIEZOSPECTROSCOPY; ROOT-MEAN-SQUARE ERROR; THERMALLY GROWN OXIDE;

THERMAL BARRIER COATINGS;

LIFE CYCLE; NEURAL NETWORKS; PHOTOLUMINESCENCE; REGRESSION ANALYSIS; SPECTROSCOPY; THERMAL BARRIER COATINGS;

EID: 33746135270     PISSN: 07424795     EISSN: None     Source Type: Journal    
DOI: 10.1115/1.2135820     Document Type: Article

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