Residual stress measurement of thermal barrier coatings using laser fluorescence technique and their life prediction

AUTOTESTCON (Proceedings)

Volumn , Issue , 2001, Pages 593-603

  Jordan, E H ^a   Sohn, Y H ^a   Xie, W ^a   Gell, M ^a   Xie, L ^a   Tu, F ^a   Pattipati, K R ^a   Willett, P ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

Coatings; Damage; Neural network; Prognostics; Stress measurement

Indexed keywords

FLUORESCENCE; MECHANICAL VARIABLES MEASUREMENT; METALS; NEURAL NETWORKS; OPTICAL VARIABLES MEASUREMENT; OXIDES; REGRESSION ANALYSIS; RELIABILITY; RESIDUAL STRESSES;

LASER FLUORESCENCE TECHNIQUE; PROGNOSTICS; RESIDUAL STRESS MEASUREMENT;

THERMAL BARRIER COATINGS;

EID: 0035557267     PISSN: 07347510     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)

1. Thermal cycling of EB-PVD/McrA.Y thermal barrier coatings: I. Microstructure development and spallation mechanisms
2. Pattern classification