Photoluminescence piezospectroscopy: A multi-purpose quality control and NDI technique for thermal barrier coatings

International Journal of Applied Ceramic Technology

Volumn 1, Issue 4, 2004, Pages 316-329

  Gell, Maurice ^a   Sridharan, Swetha ^a   Wen, Mei ^a   Jordan, Eric H ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; GROWTH (MATERIALS); INSPECTION; NONDESTRUCTIVE EXAMINATION; OXIDES; PHOTOLUMINESCENCE; PIEZOELECTRIC DEVICES; QUALITY CONTROL; SPECTROSCOPY; STRESSES; THERMAL BARRIER COATINGS;

MULTIPURPOSE QUALITY CONTROL; NONDESTRUCTIVE INSPECTION; PHOTOLUMINESCENCE PIEZOSPECTROSCOPY; STRESS MEASUREMENT; THERMALLY GROWN OXIDE;

CERAMIC COATINGS;

EID: 10644290989     PISSN: 1546542X     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1744-7402.2004.tb00183.x     Document Type: Article

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