Application of dynamic phase shifting with wavelet analysis to electronic speckle contouring

Applied Optics

Volumn 45, Issue 16, 2006, Pages 3704-3711

  Goudemand, Nicolas ^a,b  

^a Institute of Mechanical Systems (IMES)   (Switzerland)

^b PALÄONTOLOGISCHES INSTITUT UND MUSEUM   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTORS; IMAGE SEGMENTATION; INTERFEROMETRY; LIGHTING; MATHEMATICAL MODELS; PATTERN MATCHING; SPECKLE;

GEOMETRIC MODEL; ILLUMINATION ELECTRONIC; PHASE UNWRAPPING;

PHASE SHIFT;

EID: 33746087275     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.45.003704     Document Type: Article

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