Wavelet processing of interferometric signals and fringe patterns

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3813, Issue , 1999, Pages 692-702

  Cherbuliez, Michel ^a   Jacquot, Pierre ^a   de Lega, Xavier Colonna ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; INTERFEROMETRY; OPTICAL RESOLVING POWER; REAL TIME SYSTEMS; SIGNAL INTERFERENCE;

DEFORMATION MEASUREMENT; DISPLACEMENT MEASUREMENT; FRINGE PATTERNS; INTERFEROMETRIC SIGNALS; MORLET TRANSFORM; SHAPE MEASUREMENT;

WAVELET TRANSFORMS;

EID: 0033315310     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (27)