Shape measurement by use of temporal fourier transformation in dual-beam illumination speckle interferometry

Applied Optics

Volumn 37, Issue 16, 1998, Pages 3385-3390

  Joenathan, C ^a,b   Franze, B ^a   Haible, P ^a   Tiziani, H J ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

^b ROSE HULMAN INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000549778     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.37.003385     Document Type: Article

References (10)

1. R. K. Erf, Speckle Metrology (Academic, New York, 1978).
2. R. Jones and C. Wykes, Holographic and Speckle Interferom-etry (Cambridge U. Press, London, 1983).
3. R. S. Sirohi, Speckle Metrology (Dekker, New York, 1993).
4. C. Joenathan, “Speckle photography, shearography, and ESPI, ” in Optical Methods for Testing, P. Rastogi, ed. (Artech House, London, 1997).
5. H. Tiziani, B. Franze, and P. Haible, “Wavelength-shift speckle interferometry for absolute profilometry using a mode-hop free external cavity diode laser, ” J. Mod. Opt. 44, 1485-1496 (1997).
6. M. Takeda and H. Yamamoto, “Fourier-transform speckle profilometry: three-dimensional shape measurements of a dif fuse object with large height steps and/or spatially isolated surfaces, ” Appl. Opt. 33, 7829-7837 (1994).
7. S. Kuwamura and I. Yamaguchi, “Wavelength scanning pro-filometry for real-time surface shape measurement, ” Appl. Opt. 36, 4473-4482 (1997).
8. A. R. Ganesan and R. S. Sirohi, “New method of contouring using digital speckle pattern interferometry, ” in Optical Testing and Metrology II, C. P. Grover, ed., Proc. SPIE 954, 327-332 (1988).
9. C. Joenathan, B. Pfister, and H. J. Tiziani, “Contouring by electronic speckle pattern interferometry using dual beam illumination, ” Appl. Opt. 29, 1905-1911 (1990).
10. C. Joenathan, B. Franze, P. Haible, and H. J. Tiziani, “Speckle interferometry with temporal phase evaluation for measuring large-object deformation, ” Appl. Opt. 37, 2608-2614 (1998).