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Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 436-439

Quantification of deuterium irradiation induced defect concentrations in tungsten

Author keywords

Defect; Deuterium; NRA; SIMS; Tungsten

Indexed keywords

CONCENTRATION (PROCESS); DEFECTS; FUSION REACTORS; PLASMA APPLICATIONS; SECONDARY ION MASS SPECTROMETRY; TUNGSTEN;

EID: 33745963411     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.03.025     Document Type: Article
Times cited : (12)

References (19)
  • 14
    • 33745954141 scopus 로고    scopus 로고
    • M. Mayer, SIMNRA's User's Guide, Tech. Rep. IPP 9/113, Max-Planck-Institut für Plasmaphysik, Garching, 1997.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.