Deuterium retention in single crystal tungsten

Journal of Nuclear Materials

Volumn 290-293, Issue , 2001, Pages 85-88

  Haasz, A A ^a   Poon, M ^a   Macaulay Newcombe, R G ^a   Davis, J W ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ION IMPLANTATION; SATURATION (MATERIALS COMPOSITION); SECONDARY ION MASS SPECTROMETRY; SINGLE CRYSTALS; TUNGSTEN;

DEPTH PROFILE ANALYSIS;

DEUTERIUM;

EID: 0035276201     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(00)00615-2     Document Type: Article

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