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Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 358-361

Defect production in neutron irradiated GaN

Author keywords

GaN; Neutron irradiation; RBS; XRD

Indexed keywords

DEFECTS; NEUTRON IRRADIATION; PARAMETER ESTIMATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; X RAY DIFFRACTION;

EID: 33745961525     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.04.028     Document Type: Article
Times cited : (29)

References (11)
  • 1
    • 33745967170 scopus 로고    scopus 로고
    • Standard practice for characterizing neutron energy fluence spectra in terms of an equivalent monoenergetic neutron fluence for radiation-hardness testing of electronics, ASTM Standard E722-04, 2004.
  • 9
    • 33745953507 scopus 로고    scopus 로고
    • K. Lorenz, Ph.D. Thesis, University of Bonn, 2002.
  • 11
    • 33745969082 scopus 로고    scopus 로고
    • M.A. Lone, R.A. Leavitt, D.A. Harrison, IAEA-NDS-115, IAEA, Vienna, 1989.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.