Power losses and thermal modeling of a 4H-SiC VJFET inverter

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 4, Issue , 2005, Pages 2630-2634

  Zhang, Hui ^a   Tolbert, Leon M ^a,b   Ozpineci, Burak ^b   Chinthavali, Madhu S ^b  

^a University of Tennessee Knoxville   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

Inverter; Power loss modeling; Schottky diode; Silicon Carbide (SiC); Thermal modeling; VJFET

Indexed keywords

PARAMETER EXTRACTION; POWER LOSS MODELING; SCHOTTKY DIODE; THERMAL MODELING; VJFET;

COMPUTER SIMULATION; DIODES; ELECTRIC INVERTERS; ENERGY EFFICIENCY; HEAT SINKS; THERMAL EFFECTS;

SILICON CARBIDE;

EID: 33745945870     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IAS.2005.1518831     Document Type: Conference Paper

References (7)

1. M. Roschke, "Electron mobolity models for 4H, 6H, and 3C SiC," IEEE Transactions on Electron Devices, vol. 48, no.7, July 2001, pp. 1442-1447.
2. S. Selberherr, Analysis and Simulation of Semiconductor Devices, Springer-Verlag/Wien, New York, 1984.
3. L. M. Tolbert, B. Ozpineci, S. Islam, M. Hasanuzzaman, "Effects of silicon carbide (SiC) power devices on HEV PWM Inverter Losses," IEEE Industrial Electronics Conference, Nov 29 - Dec 2, 2001, Denver, Colorado, pp. 1061-1066.
4. A. Q. Huang, B. Zhang, "Comparing SiC switching power devices: MOSFET, NPN transistor and GTO thyristor," Solid-State Electronics, vol. 44, 2000, pp. 325-340.
5. V. Blasko, R. Lukaszewski, R. Sladky, "On line thermal model and thermal management strategy of a three phase voltage source inverter," IEEE Industry Application Societ Annual Meeting, October 3-7, 1999, Phoenix, Arizona, pp. 1423-1431.
6. N. Mohan, T. M. Undeland, W. P. Robbins, Power Electronics, 2nd ed., John Wiley & Sons Inc., 1995.
7. M. Chinthavali, B. Ozpineci, L. M. Tolbert, "High Temperature and High Frequency Performance Evaluation of 4H-SiC Unipolar Devices," IEEE Applied Power Electronics Conference, March 6-10, 2005, Austin, Texas, pp. 322-328.