Desorption/ionization on self-assembled monolayer surfaces (DIAMS)

Journal of Mass Spectrometry

Volumn 41, Issue 6, 2006, Pages 830-833

  Sanguinet, L ^b   Aleveque O ^b   Blanchard, P ^b   Dias, M ^b   Levillain, E ^a,b   Rondeau, D ^a  

^a UNIVERSITÉ D'ANGERS   (France)

^b UNIVERSITÉ D'ANGERS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALKENE DERIVATIVE; ALLOY; ALUMINUM; CARBON; CATION; GRAPHITE; MACROGOL 400; OXIDE; SILICON; THIOL;

CHEMICAL ANALYSIS; CHROMATOPHORE; CRYSTALLIZATION; DESORPTION; ENERGY ABSORPTION; ENERGY EXPENDITURE; INFRARED RADIATION; IONIZING RADIATION; LASER; LETTER; LIGHT ABSORPTION; LIPID ANALYSIS; MASS SPECTROMETRY; MATRIX ASSISTED LASER DESORPTION IONIZATION TIME OF FLIGHT MASS SPECTROMETRY; MOLECULAR WEIGHT; PARTICLE RADIATION; PHOTON; PRIORITY JOURNAL; PROTEIN MICROARRAY; SEMICONDUCTOR; TIME OF FLIGHT MASS SPECTROMETRY; ULTRAVIOLET RADIATION;

EID: 33745872622     PISSN: 10765174     EISSN: 10969888     Source Type: Journal    
DOI: 10.1002/jms.1036     Document Type: Letter

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