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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 843-846

Ion beam synthesis and characterization of Ge nanoparticles in SiO2

(8) Desnica, U V a Buljan, M a Dubcek, P a Siketic, Z a Radovic, I Bogdanovic a Bernstorff, S b Serincan, U c Turan, R c

a RUDER BO KOVI INSTITUTE (Croatia)

b SINCROTRONE TRIESTE (Italy)

c MIDDLE EAST TECHNICAL UNIVERSITY (Turkey)

Author keywords

Ge implantation; GISAXS; Ion beam mixing; Nanocrystals; RBS; XRD

Indexed keywords

ANNEALING; EMBEDDED SYSTEMS; GERMANIUM; ION BEAMS; ION IMPLANTATION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR QUANTUM DOTS; SILICA; X RAY DIFFRACTION;

GE IMPLANTATION; GISAXS; ION BEAM MIXING; X-RAY SCATTERING;

NANOSTRUCTURED MATERIALS;

EID: 33745834779 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/j.nimb.2006.03.151 Document Type: Article

Times cited : (13)

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