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Volumn 130, Issue 1-4, 1997, Pages 230-236
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Heavy ion and proton beams in high resolution imaging of a fungi spore specimen using STIM tomography
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Author keywords
[No Author keywords available]
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Indexed keywords
FUNGI;
IMAGING TECHNIQUES;
ION BEAMS;
MICROSCOPIC EXAMINATION;
MORPHOLOGY;
NONDESTRUCTIVE EXAMINATION;
PROTONS;
POISSON COUNTING STATISTICS;
SCANNING TRANSMISSION ION MICROSCOPY (STIM) TOMOGRAPHY;
NUCLEAR INSTRUMENTATION;
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EID: 0031549008
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(97)00051-7 Document Type: Article |
Times cited : (5)
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References (18)
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