Atomic force microscopic examination of chromosomes treated with trypsin or ethidium bromide

Chemical and Pharmaceutical Bulletin

Volumn 54, Issue 4, 2006, Pages 501-505

  Wu, Yangzhe ^a   Cai, Jiye ^a   Cheng, Longqiu ^a   Yun, Keyu ^a   Wang, Chenxi ^a   Chen, Yong ^b  

^a JINAN UNIVERSITY   (China)

^b UNIVERSITY OF ILLINOIS AT CHICAGO   (United States)

Author keywords

Atomic force microscope; Chromosome damage; Ethidium bromide; Trypsinization

Indexed keywords

ETHIDIUM BROMIDE; TRYPSIN;

ARTICLE; ATOMIC FORCE MICROSCOPY; BLOOD CELL; CELL CULTURE; CENTROMERE; CHROMOSOME BREAKAGE; CHROMOSOME DAMAGE; CHROMOSOME HIGH RESOLUTION BANDING ANALYSIS; CHROMOSOME STRUCTURE; CONTROLLED STUDY; FEMALE; HUMAN; HUMAN CELL; INCUBATION TIME;

BLOOD CELLS; CELLS, CULTURED; CHROMOSOME ABERRATIONS; CHROMOSOMES, HUMAN; DOSE-RESPONSE RELATIONSHIP, DRUG; ETHIDIUM; HUMANS; MICROSCOPY, ATOMIC FORCE; TRYPSIN;

ELECTRIC POTENTIAL; ELECTRIC PROPERTIES; ELECTRON IRRADIATION; PROTON IRRADIATION; SHORT CIRCUIT CURRENTS;

ADDITIVITY; BACK FIELD SILICON SOLAR CELLS; ELECTRON FLUENCES; IN SITU MEASUREMENTS;

SILICON SOLAR CELLS;

EID: 33745739568     PISSN: 00092363     EISSN: 13475223     Source Type: Journal    
DOI: 10.1248/cpb.54.501     Document Type: Article

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