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Volumn 2005, Issue , 2005, Pages 503-509

Transient analysis of impact fracturing of solder joints

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; FINITE ELEMENT METHOD; INTERMETALLICS; NUMERICAL ANALYSIS;

EID: 33745726129     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESIME.2005.1502857     Document Type: Conference Paper
Times cited : (8)

References (9)
  • 1
    • 33645162641 scopus 로고    scopus 로고
    • Brittle fracture of Pb-free solder joint in Ni/Au finished FBGA MCP mounted on OSP board subjected to bending impact load
    • Long Beach, CA
    • th Int. Symp. Microelectr., Long Beach, CA, 2004.
    • (2004) th Int. Symp. Microelectr.
    • Moon, H.J.1
  • 2
    • 30844460176 scopus 로고    scopus 로고
    • Board-level drop performance of lead-free chip-scale packages with different soldermask openings and solder compositions
    • Penang, Malaysia
    • th Int. Conf. Electr. Mater. Pack., Penang, Malaysia, 2004, pp. 56-60.
    • (2004) th Int. Conf. Electr. Mater. Pack. , pp. 56-60
    • Lai, Y.-S.1
  • 3
    • 0034835530 scopus 로고    scopus 로고
    • Characterization and analysis on the solder ball shear testing conditions
    • Orlando, FL
    • st Electr. Comp. Technol. Conf., Orlando, FL, 2001, pp. 1065-1071.
    • (2001) st Electr. Comp. Technol. Conf. , pp. 1065-1071
    • Huang, X.1
  • 4
    • 3142756580 scopus 로고    scopus 로고
    • Ductile-to-brittle transition in Sn-Zn solder joints measured by impact test
    • Date, M. et al, "Ductile-to-brittle Transition in Sn-Zn Solder Joints Measured by Impact Test," Scripta Materialia Vo. 51 (2004), pp. 641-645.
    • (2004) Scripta Materialia , vol.51 , pp. 641-645
    • Date, M.1
  • 5
    • 33745687827 scopus 로고    scopus 로고
    • Transient deformation and fracturing of solder joints subjected to impact loads
    • Austin, TX
    • Yeh, C.-L. et al, "Transient Deformation and Fracturing of Solder Joints Subjected to Impact Loads," Proc IMAPS Flip Chip 2004, Austin, TX, 2004.
    • (2004) Proc IMAPS Flip Chip 2004
    • Yeh, C.-L.1
  • 6
    • 28444484336 scopus 로고    scopus 로고
    • Transient simulation of solder joint fracturing under impact test
    • Singapore
    • Yeh, C.-L. and Lai, Y.-S., "Transient Simulation of Solder Joint Fracturing Under Impact Test," Proc & Electr. Pack. Technol. Conf., Singapore, 2004, pp. 689-694.
    • (2004) Proc & Electr. Pack. Technol. Conf. , pp. 689-694
    • Yeh, C.-L.1    Lai, Y.-S.2
  • 7
    • 84949948176 scopus 로고    scopus 로고
    • Time-independent plastic behavior of solders and its effect on FEM simulations for electronic packages
    • Atlanta, GA
    • th Int. Symp. Adv. Pack. Mater., Atlanta, GA, 2002, pp. 104-111.
    • (2002) th Int. Symp. Adv. Pack. Mater. , pp. 104-111
    • Wiese, S.1
  • 9
    • 0023136432 scopus 로고
    • A three-dimensional impact-penetration algorithm with erosion
    • Belytschko, T. and Lin, J.-I., "A Three-dimensional Impact-penetration Algorithm with Erosion," Computers & Structures Vol. 25, No. 1 (1987), pp. 95-104.
    • (1987) Computers & Structures , vol.25 , Issue.1 , pp. 95-104
    • Belytschko, T.1    Lin, J.-I.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.