Self-assembly of extended polycyclic aromatic hydrocarbons on Cu(111)

Journal of Physical Chemistry B

Volumn 110, Issue 23, 2006, Pages 11253-11258

  Ruffieux, Pascal ^a   Gröning, Oliver ^a   Fasel, Roman ^a   Kastler, Marcel ^b   Wasserfallen, Daniel ^b   Müllen, Klaus ^b   Gröning, Pierangelo ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LATTICE CONSTANTS; MOLECULAR ORIENTATION; MONOLAYERS; SCANNING TUNNELING MICROSCOPY; SELF ASSEMBLY; SURFACE PROPERTIES;

MOLECULAR LATTICE; MOLECULE-SUBSTRATE INTERACTIONS; ORIENTATIONAL ORDERING;

POLYCYCLIC AROMATIC HYDROCARBONS;

EID: 33745699403     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp057158w     Document Type: Article

References (25)

1. Whitesides, G. M.; Grzybowski, B. Science 2002, 295, 2418.
2. Yokoyama, T.; Yokoyama, S.; Kamikado, T.; Okuno, Y.; Mashiko, S. Nature 2001, 413, 619.
3. Brune, H.; Giovannini, M.; Bromann, K.; Kern, K. Nature 1998, 394, 451.
4. Brune, H. Surf. Sci. Rep. 1998, 31, 121.
5. Corso, M.; Auwärter, W.; Muntwiler, M.; Tamai, A.; Greber, T.; Osterwalder, J. Science 2004, 303, 217.
6. Roussel, S.; Repain, V.; Baudot, G.; Garreau, Y.; Lecoeur, J. J. Phys.: Condens. Matter 2003, 15, S3363.
7. Theobald, J. A.; Oxtoby, N. S.; Philips, M. A.; Champness, N. R.; Beton, P. H. Nature 2003, 424, 1029.
8. Barth, J. V.; Weckesser, J.; Cai, C; Günter, P.; Bürgi, L.; Jeandupeux, O.; Kern, K. Angew. Chem., Int. Ed. 2000, 39, 1230.
9. Lin, N.; Dmitriev, A.; Spillmann, H.; Messina, P.; Lingenfelder, M.; Stepanow, S.; Barth, J. V.; Kern, K. 12th International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques. AIP Conf. Proc. 2003, 696, 144.
10. Samori, P.; Severin, N.; Simpson, C. D.; Müllen, K.; Rabe, J. J. Am. Chem. Soc. 2002, 124, 9454.
11. Jacket, F.; Watson, M. D.; Müllen, K.; Rabe, J. P. Phys. Rev. Lett. 2004, 92, 188303.
12. Florio, G. M.; Werblowsky, T. L.; Müller, T.; Berne, B. J.; Flynn, G. W. J. Phys. Chem. B 2005, 109, 4520.
13. Lackinger, M.; Griessl, S.; Heckl, W. M.; Hietschold, M. Anal. Bioanal. Chem. 2002, 374, 685.
14. Lackinger, M.; Müller, T.; Gopakumar, T. G.; Müller, F.; Hietschold, M.; Flynn, G. W. J. Phys. Chem. B 2004, 108, 2279.
15. Herwig, P.; Kayser, C. W.; Müllen, K.; Spiess, H. W. Adv. Mater. 1996, 8, 510.
16. de Craats, A. V.; Warman, J.; Fechtenkötters, A.; Brandt, J. D.; Müllen, K.; Adv. Mater. 1999, 11, 1469.
17. Ruffieux, P.; Gröning, O.; Bielmann, M.; Simpson, C.; Müllen, K.; Schlapbach, L.; Gröning, P. Phys. Rev. B 2002, 66, 073409.
18. Omicron Nanotechnology GmbH, D.-Taunusstein.
19. Iyer, V. S.; Wehmeier, M.; Brand, J. D.; Keegstra, M. A.; Müllen, K. Angew. Chem. 1997, 109, 1675.
20. Kübel, C.; Eckhardt, K.; Enkelmann, V.; Wegner, G.; Müllen, K. J. Mater. Chem. 2000, 10, 879.
21. Gross, L.; Moresco, F.; Ruffieux, P.; Gourdon, A.; Joachim, C.; Rieder, K.-H. Phys. Rev. B 2005, 71, 165428.
22. Lukas, S.; Witte, G.; Wöll, Ch. Phys. Rev. Lett. 2002, 88, 028301.
23. Gross, L.; Moresco, F.; Savio, L.; Gourdon, A.; Joachim, C.; Rieder, K.-H. Phys. Rev. Lett. 2004, 93, 056103.
24. Karl, N.; Günther, Ch. Cryst. Res. Technol. 1999, 34, 243.
25. Günther, Ch.; Karl, N.; Pflaum, J.; Strohmaier, R.; Gompf, B.; Eisenmenger, W.; Müller, M.; Müllen, K. Langmuir 2005, 21, 656.