Photoelectron diffraction of C6 H8 Si (001): A model case for photoemission study of organic molecules adsorbed on silicon surfaces

Physical Review B - Condensed Matter and Materials Physics

Volumn 73, Issue 23, 2006, Pages

  Gunnella, R ^a   Shimomura, M ^b   D'Amico, F ^a   Abukawa, T ^c   Kono, S ^c  

^a UNIVERSITY OF CAMERINO   (Italy)

^b SHIZUOKA UNIVERSITY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33745639939     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.73.235435     Document Type: Article

References (27)

1. W. F. Egelhoff, Surf. Sci. Rep. SSREDI 0167-5729 10.1016/0167-5729(87) 90007-0 6, 253 (1986), and references therein.
2. C. S. Fadley, in Synchrotron Radiation Research: Advances in Surface Science, edited by, Z. Bachrach, (Plenum Press, New York, 1990).
3. M. A. Filler and S. F. Bent, Prog. Surf. Sci. PSSFBP 0079-6816 10.1016/S0079-6816(03)00035-2 73, 1 (2003).
4. G. T. Wang, C. Mui, Charles B. Musgrave, and S. F. Bent, J. Am. Chem. Soc. JACSAT 0002-7863 10.1021/ja980243f 120, 7377 (1998).
5. R. A. Wolkow, Annu. Rev. Phys. Chem. ARPLAP 0066-426X 10.1146/annurev.physchem.50.1.413 50, 413 (1999).
6. R. Konecny and D. Doren, Surf. Sci. SUSCAS 0039-6028 10.1016/S0039- 6028(98)00554-8 417, 169 (1998).
7. F. Rochet, F. Bournel, J.-J. Gallet, G. Dufour, L. Lozzi, and F. Sirotti, J. Phys. Chem. B JPCBFK 1089-5647 10.1021/jp013780m 106, 4967 (2002).
8. Y. K. Kim, M. H. Lee, and H. W. Yeom, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.71.115311 71, 115311 (2005).
9. J. Yoshinobu, H. Tsudo, M. Ouchi, and M. Nishijima, J. Chem. Phys. JCPSA6 0021-9606 10.1063/1.453327 87, 7332 (1987).
10. K. Hamaguchi, S. Machida, M. Nagao, F. Yasui, K. Mukai, Y. Yamashita, J. Yoshinobu, H. S. Kato, H. Okuyama, M. Kawai, T. Sato, and M. Iwatsuki, J. Phys. Chem. B JPCBFK 1089-5647 10.1021/jp0029358 105, 3718 (2001).
11. K. Hamaguchi, S. Machida, K. Mukai, Y. Yamashita, and J. Yoshinobu, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.62.7576 62, 7576 (2000).
12. K. Hamaguchi, K. Mukai, Y. Yamashita, J. Yoshinobu, T. Sato, and M. Iwatsuki, Surf. Sci. SUSCAS 0039-6028 531, 199 (2003).
13. K. Akagi and S. Tsuneyuki, Surf. Sci. SUSCAS 0039-6028 10.1016/S0039-6028(01)01200-6 493, 131 (1999).
14. K. Akagi, S. Tsuneyuki, Y. Yamashita, K. Hamaguchi, and J. Yoshinobu, Appl. Surf. Sci. ASUSEE 0169-4332 234, 162 (2004).
15. K. Wakatsuchi, H. S. Kato, H. Fujisawa, and M. Kawai, J. Electron Spectrosc. Relat. Phenom. JESRAW 0368-2048 137-140, 217 (2004).
16. J.-H. Cho, D.-H. Oh, K. S. Kim, and L. Kleinman, J. Chem. Phys. JCPSA6 0021-9606 10.1063/1.1448293 116, 3800 (2002).
17. R. Gunnella, M. Shimomura, M. Munakata, T. Takano, T. Yamazaki, T. Abukawa, and S. Kono, Surf. Sci. SUSCAS 0039-6028 566-568, 618 (2004);
18. and (unpublished).
19. F. Tao, Z. H. Wang, and G. Q. Xu, Surf. Sci. SUSCAS 0039-6028 530, 203 (2003).
20. Y. Yamashita, S. Machida, M. Nagao, S. Yamamoto, K. Mukai, and J. Yoshinobu, Chem. Phys. Lett. CHPLBC 0009-2614 374, 476 (2003).
21. R. Gunnella, E. L. Bullock, L. Patthey, C. R. Natoli, T. Abukawa, S. Kono, and L. S. O. Johansson, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.57. 14739 57, 14739 (1998);
22. E. L. Bullock, R. Gunnella, L. Patthey, T. Abukawa, S. Kono, C. R. Natoli, and L. S. O. Johansson, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.74.2756 74, 2756 (1995).
23. D. Sebilleau, R. Gunnella, S. Di Matteo, Z.-Y. Wu, and C. R. Natoli, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/18/9/R01 18, R175 (2006).
24. R. Gunnella, F. Solal, D. Sebilleau, and C. R. Natoli, Comput. Phys. Commun. CPHCBZ 0010-4655 10.1016/S0010-4655(00)00145-4 132, 251 (2000).
25. S. Dreiner, M. Schurmann, and C. Westphal, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.93.126101 93, 126101 (2004).
26. V. M. Oltedal, K. J. Borve, L. J. Sthre, T. D. Thomas, J. D. Bozek, and E. Kukk, Phys. Chem. Chem. Phys. PPCPFQ 1463-9076 10.1039/b405109b 6, 4254 (2004).
27. H. Liu and R. J. Hamers, Surf. Sci. SUSCAS 0039-6028 10.1016/S0039- 6028(98)00507-X 416, 354 (1998).