Structural study of 1,4-cyclohexadiene adsorption on Si(0 0 1) surface by low energy photoelectron diffraction

Surface Science

Volumn 566-568, Issue 1-3 PART 1, 2004, Pages 618-623

  Gunnella, R ^a,b   Shimomura, M ^c,d   Munakata, M ^c   Takano, T ^c   Yamazaki, T ^c   Abukawa, T ^c   Kono, S ^c  

^a UNIVERSITY OF CAMERINO   (Italy)

^b INFN LABORATORI NAZIONALI DI FRASCATI   (Italy)

^c TOHOKU UNIVERSITY   (Japan)

^d SHIZUOKA UNIVERSITY   (Japan)

Author keywords

Carbon; Chemisorption; Photoemission (total yield); Self assembly; Surface structure, morphology, roughness, and topography

Indexed keywords

ADSORPTION; CARBON; CHEMISORPTION; LOW ENERGY ELECTRON DIFFRACTION; PHOTOEMISSION; SCATTERING; SELF ASSEMBLY; STEREOCHEMISTRY; SUBSTRATES; SURFACE STRUCTURE;

COVALENT BONDING; MULTIPLE SCATTERING ANALYSIS; SILICON SUBSTRATES;

SILICON;

EID: 4544283312     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.05.122     Document Type: Conference Paper

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