Interfacial effects on the electrical properties of multiferroic BiFeO 3/Pt/Si thin film heterostructures

Thin Solid Films

Volumn 493, Issue 1-2, 2005, Pages 24-29

  Yakovlev, S ^a   Zekonyte, J ^b   Solterbeck, C H ^a   Es Souni, M ^a  

^a UNIVERSITY OF APPLIED SCIENCES   (Germany)

^b UNIVERSITY OF KIEL   (Germany)

Author keywords

Bismuth ferrite; Dielectric properties; Interfaces; Leakage currents

Indexed keywords

BISMUTH COMPOUNDS; ELECTRIC PROPERTIES; LEAKAGE CURRENTS; PERMITTIVITY; SURFACE CHEMISTRY; THIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

BISMUTH FERRITE; CHEMICAL SOLUTION DEPOSITION; INTERFACES; POOLE-FRENKEL MECHANISMS;

HETEROJUNCTIONS;

EID: 27144434082     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.06.020     Document Type: Article

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