Carrier dynamics in microcrystalline silicon studied by time-resolved terahertz spectroscopy

Journal of Non-Crystalline Solids

Volumn 352, Issue 26-27, 2006, Pages 2846-2849

  Fekete, L ^a   Nemec H ^a   Kadlec, F ^a   Kuzel P ^a   Stuchlik J ^a   Fejfar, A ^a   Kocka J ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Chemical vapor deposition; Dielectric properties, relaxation, electric modulus; Microcrystallinity; Silicon; Solar cells

Indexed keywords

CARRIER CONCENTRATION; CHEMICAL VAPOR DEPOSITION; DIELECTRIC RELAXATION; SEMICONDUCTING SILICON; SOLAR CELLS; THIN FILMS;

DIELECTRIC PROPERTIES, RELAXATION, ELECTRIC MODULUS; MICROCRYSTALLINITY;

SEMICONDUCTING FILMS;

EID: 33745592486     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2006.02.099     Document Type: Article

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