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Volumn 97, Issue 6, 2006, Pages 699-709

Evolution of C-rich SiOC ceramics Part I. Characterization by integral spectroscopic techniques: Solid-state NMR and Raman spectroscopy

Author keywords

NMR; Raman soectroscopy; SiOC ceramics; Structural rearrangement; Thermal stability

Indexed keywords

CARBON; CHEMICAL MODIFICATION; HEAT TREATMENT; IMAGE ANALYSIS; MICROSTRUCTURE; NUCLEAR MAGNETIC RESONANCE; PYROLYSIS; RAMAN SPECTROSCOPY; SILICON COMPOUNDS; SPECTROSCOPIC ANALYSIS; THERMODYNAMIC STABILITY; TRANSMISSION ELECTRON MICROSCOPY; AMORPHOUS CARBON; CARBOTHERMAL REDUCTION; CERAMIC MATERIALS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ENERGY DISSIPATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LIGHT POLARIZATION; SILICON CARBIDE;

EID: 33745585814     PISSN: 18625282     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (68)

References (32)
  • 3
    • 33745584454 scopus 로고    scopus 로고
    • US Patent 5,958,324
    • D.R. Bujalski, K. Su: US Patent 5,958,324 (1999).
    • (1999)
    • Bujalski, D.R.1    Su, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.