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Volumn 97, Issue 6, 2006, Pages 699-709
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Evolution of C-rich SiOC ceramics Part I. Characterization by integral spectroscopic techniques: Solid-state NMR and Raman spectroscopy
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Author keywords
NMR; Raman soectroscopy; SiOC ceramics; Structural rearrangement; Thermal stability
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Indexed keywords
CARBON;
CHEMICAL MODIFICATION;
HEAT TREATMENT;
IMAGE ANALYSIS;
MICROSTRUCTURE;
NUCLEAR MAGNETIC RESONANCE;
PYROLYSIS;
RAMAN SPECTROSCOPY;
SILICON COMPOUNDS;
SPECTROSCOPIC ANALYSIS;
THERMODYNAMIC STABILITY;
TRANSMISSION ELECTRON MICROSCOPY;
AMORPHOUS CARBON;
CARBOTHERMAL REDUCTION;
CERAMIC MATERIALS;
ELECTRON ENERGY LOSS SPECTROSCOPY;
ELECTRON SCATTERING;
ENERGY DISSIPATION;
HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;
LIGHT POLARIZATION;
SILICON CARBIDE;
ELECTRON ENERGY-LOSS SPECTROSCOPY (EELS);
HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM);
SIOC CERAMICS;
STRUCTURAL REARRANGEMENTS;
CERAMIC MATERIALS;
NUCLEAR MAGNETIC RESONANCE SPECTROSCOPY;
CARBON RICH;
CERAMIC PARTS;
FREE CARBON;
NMR AND RAMAN SPECTROSCOPY;
POLYMER-DERIVED CERAMICS;
RAMAN SOECTROSCOPY;
SIOC CERAMIC;
SOLID STATE NMR;
SPECTROSCOPIC TECHNIQUE;
STRUCTURAL REARRANGEMENT;
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EID: 33745585814
PISSN: 18625282
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (68)
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References (32)
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