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Volumn 84, Issue 10, 2001, Pages 2189-2196

Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy Study of Nonstoichiometric Silicon-Carbon-Oxygen Glasses

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLIZATION; ELECTRON ENERGY LOSS SPECTROSCOPY; PYROLYSIS; SILICON COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0035497588     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.2001.tb00986.x     Document Type: Article
Times cited : (78)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.