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Volumn 24, Issue 4, 2006, Pages 1252-1257

Comparison of a dominant electron trap in n -type and p -type GaNAs using deep-level transient spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON-TRAP CONCENTRATIONS; HOLE CONCENTRATIONS; POOLE-FRENKEL EFFECT; ZERO-BIAS FILLING PULSES;

EID: 33745513673     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2167081     Document Type: Article
Times cited : (30)

References (18)
  • 17
    • 33745496167 scopus 로고    scopus 로고
    • SIM WINDOWS is a semiconductor device simulator originally developed at the Optoelectronics Computing Systems Center at the University of Colorado, Boulder.
    • SIM WINDOWS is a semiconductor device simulator originally developed at the Optoelectronics Computing Systems Center at the University of Colorado, Boulder.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.