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Volumn 326, Issue 1, 2006, Pages 252-258
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Shallow traps for thermally induced hole hopping in DNA
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Author keywords
DNA molecular electronics; Long range charge transport; Thermally induced hopping
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Indexed keywords
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EID: 33745510707
PISSN: 03010104
EISSN: None
Source Type: Journal
DOI: 10.1016/j.chemphys.2006.01.009 Document Type: Article |
Times cited : (22)
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References (53)
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