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Volumn 2005, Issue , 2005, Pages 155-158

Causality check for SI data validation

Author keywords

Causality; Equivalent circuits; SPICE

Indexed keywords

DATABASE SYSTEMS; MATHEMATICAL TRANSFORMATIONS; PARAMETER ESTIMATION; PRINTED CIRCUIT BOARDS; TRANSFER FUNCTIONS;

EID: 33745497898     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SPI.2005.1500932     Document Type: Conference Paper
Times cited : (10)

References (15)
  • 1
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    • Ruehli, A.E.1
  • 2
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    • Damstadt, Germany
    • Computer Simulation Tecnology, MWS User Manual - ver. 5.1, Damstadt, Germany, 2004
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  • 4
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    • P.K.Gunupundi, M.Nakhla, R.Achar, "Simulation of high-speed distributed interconnects using Krylov-space techniques", IEEE Transactions on Computer-Aided Design, vol. 19, n.7, July 2000, pp. 799-808.
    • (2000) IEEE Transactions on Computer-aided Design , vol.19 , Issue.7 , pp. 799-808
    • Gunupundi, P.K.1    Nakhla, M.2    Achar, R.3
  • 5
    • 0041360513 scopus 로고    scopus 로고
    • Spice equivalent circuits of frequency domain response
    • August
    • G.Antonini, "Spice equivalent circuits of frequency domain response", IEEE Transactions on Electromagn. Compatibility, vol. 45, n. 3, August 2003, pp. 502-512.
    • (2003) IEEE Transactions on Electromagn. Compatibility , vol.45 , Issue.3 , pp. 502-512
    • Antonini, G.1
  • 10
    • 0026908842 scopus 로고
    • On the use of Hilbert transform for processing measured CW data
    • August
    • F.M.Tesche, "On the use of Hilbert transform for processing measured CW data", IEEE Transactions on Electromagn. Compatibility, vol. 34, n. 3, August 1992, pp. 259-266.
    • (1992) IEEE Transactions on Electromagn. Compatibility , vol.34 , Issue.3 , pp. 259-266
    • Tesche, F.M.1
  • 13
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    • Transient analysis of lossy transmission lines: An efficient approach based on the method of characteristics
    • Febr.
    • F.Canavero, A.Ruehli et Al., "Transient analysis of lossy transmission lines: an efficient approach based on the method of characteristics", IEEE Trans. on Advanced Packaging, vol. 27, n.1, Febr. 2004, pp. 45-54.
    • (2004) IEEE Trans. on Advanced Packaging , vol.27 , Issue.1 , pp. 45-54
    • Canavero, F.1    Ruehli, A.2
  • 14
    • 9244249839 scopus 로고    scopus 로고
    • De-embedding procedure based on computed/measured data set for PCS structure characterization
    • Nov.
    • G.Antonini, A.Ciccomancini Scogna, A.Orlandi, "De-Embedding procedure based on computed/measured data set for PCS structure characterization", IEEE Trans. on Advanced Packaging, vol. 27, n. 4, Nov. 2004, pp. 597-602.
    • (2004) IEEE Trans. on Advanced Packaging , vol.27 , Issue.4 , pp. 597-602
    • Antonini, G.1    Ciccomancini Scogna, A.2    Orlandi, A.3
  • 15
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    • Validation of equivalent circuits extraction from S-parameters data for eye pattern evaluation
    • S.Clara, CA,USA,9-13August,20
    • G.Selli, M.Lai et Al., "Validation of equivalent circuits extraction from S-parameters data for eye pattern evaluation", in Proc. of 2004 Int. Symp on EMC, S.Clara, CA,USA,9-13August,20
    • Proc. of 2004 Int. Symp on EMC
    • Selli, G.1    Lai, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.