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Volumn 31, Issue 10, 2006, Pages 1405-1407

Quantitative phase-contrast microscopy by a lateral shear approach to digital holographic image reconstruction

Author keywords

[No Author keywords available]

Indexed keywords

DIGITAL HOLOGRAPHY MICROSCOPES; LATERAL SHEAR INTERFEROMETRY (LSI); OPTICAL PHASE MEASUREMENT;

EID: 33745487505     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.31.001405     Document Type: Article
Times cited : (173)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.