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Volumn 14, Issue 13, 2006, Pages 131-137

Absolute distance measurement by lateral shearing interferometry of point-diffracted spherical waves

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; MEASUREMENT THEORY; OPTICAL SYSTEMS; OPTICAL WAVEGUIDES;

EID: 33745471972     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (11)

References (12)
  • 1
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  • 2
    • 84975589602 scopus 로고
    • Two-wavelength laser interferometry using superheterodyne detection
    • R. Dändliker, R. Thalmann, and D. Prongué, "Two-wavelength laser interferometry using superheterodyne detection," Opt. Lett. 13, 339-341 (1988).
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    • Dändliker, R.1    Thalmann, R.2    Prongué, D.3
  • 3
    • 0019527566 scopus 로고
    • Absolute distance measurements by variable wavelength interferometry
    • F. Bien, M. Camac, H. J. Caulfield, and S. Ezekiel, "Absolute distance measurements by variable wavelength interferometry," Appl. Opt. 20, 400-403 (1981).
    • (1981) Appl. Opt. , vol.20 , pp. 400-403
    • Bien, F.1    Camac, M.2    Caulfield, H.J.3    Ezekiel, S.4
  • 4
    • 84975629121 scopus 로고
    • Distance measurement by the wavelength shift of laser diode light
    • H. Kikuta, K. Iwata, and R. Nagata, "Distance measurement by the wavelength shift of laser diode light," Appl. Opt. 25, 2976-2980 (1986).
    • (1986) Appl. Opt. , vol.25 , pp. 2976-2980
    • Kikuta, H.1    Iwata, K.2    Nagata, R.3
  • 5
    • 0000587172 scopus 로고    scopus 로고
    • Dispersive white-light interferometry for absolute distance measurement with dielectric multilayer systems on the target
    • U. Schnell, R. Dändliker, and S. Gray, "Dispersive white-light interferometry for absolute distance measurement with dielectric multilayer systems on the target," Opt. Lett. 21, 528-530 (1996).
    • (1996) Opt. Lett. , vol.21 , pp. 528-530
    • Schnell, U.1    Dändliker, R.2    Gray, S.3
  • 6
    • 0036795313 scopus 로고    scopus 로고
    • Absolute distance measurement by two-point-diffraction interferometry
    • H.-G. Rhee and S.-W. Kim, "Absolute distance measurement by two-point-diffraction interferometry," Appl. Opt. 41, 5921-5928 (2002).
    • (2002) Appl. Opt. , vol.41 , pp. 5921-5928
    • Rhee, H.-G.1    Kim, S.-W.2
  • 8
    • 0003426303 scopus 로고    scopus 로고
    • High-accuracy measurement of 240-m distance in an optical tunnel by use of a compact femtosecond laser
    • K. Minoshima and H. Matsumoto, "High-accuracy measurement of 240-m distance in an optical tunnel by use of a compact femtosecond laser," Appl. Opt. 39, 5512-5517 (2000).
    • (2000) Appl. Opt. , vol.39 , pp. 5512-5517
    • Minoshima, K.1    Matsumoto, H.2
  • 9
    • 2542420794 scopus 로고    scopus 로고
    • Absolute measurement of a long, arbitrary distance to less than an optical fringe
    • J. Ye, "Absolute measurement of a long, arbitrary distance to less than an optical fringe," Opt. Lett. 29, 1153-1155 (2004).
    • (2004) Opt. Lett. , vol.29 , pp. 1153-1155
    • Ye, J.1
  • 10
    • 7544236215 scopus 로고    scopus 로고
    • Nonparaxial free-space diffraction from oblique end faces of single-mode optical fibers
    • H. Kihm and S.-W. Kim, "Nonparaxial free-space diffraction from oblique end faces of single-mode optical fibers," Opt. Lett. 29, 2366-2368 (2004).
    • (2004) Opt. Lett. , vol.29 , pp. 2366-2368
    • Kihm, H.1    Kim, S.-W.2
  • 11
    • 0019927495 scopus 로고
    • Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry
    • M. Takeda, H. Ina, and S. Kobayashi, "Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry," J. Opt. Soc. Am. 72, 156-160 (1982).
    • (1982) J. Opt. Soc. Am. , vol.72 , pp. 156-160
    • Takeda, M.1    Ina, H.2    Kobayashi, S.3
  • 12
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    • Evaluation of large aberrations using a lateral shear interferometer having variable shear
    • M. P. Rimmer and J. C. Wyant, "Evaluation of large aberrations using a Lateral Shear Interferometer having variable shear," Appl. Opt. 14, 142-150 (1975).
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    • Rimmer, M.P.1    Wyant, J.C.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.