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Volumn 57, Issue 2, 2006, Pages 105-110

Raman analysis of aluminum nitride at high temperature

Author keywords

Aluminum nitride; Raman spectra; Wurtzite structure

Indexed keywords

COMPRESSIVE STRESS; DECOMPOSITION; HIGH TEMPERATURE EFFECTS; NATURAL FREQUENCIES; PHONONS; RAMAN SCATTERING;

EID: 33745256739     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2005.12.012     Document Type: Article
Times cited : (18)

References (16)
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    • Bergman L., Dutta M., Davis C.R.F., Christman J.A., Alexson D., and Nemanich R.J. Raman analysis of the E1 and A1 quasi-longitudinal optical and quasi-transverse optical modes in wurtzite AlN. J Appl Phys 85 (1999) 3535-3539
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    • Bergman, L.1    Dutta, M.2    Davis, C.R.F.3    Christman, J.A.4    Alexson, D.5    Nemanich, R.J.6
  • 9
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    • Effect of additive on self-propagating high-temperature synthesis AlN
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  • 10
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    • Vibrational spectroscopy of aluminum nitride
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  • 13
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    • The use of micro-Raman spectroscopy to monitor high-pressure high-temperature annealing of ion-implanted GaN films
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    • Kuball M., Hayes J.M., Suski T., Jun J., Tan H.H., Williams J.S., et al. The use of micro-Raman spectroscopy to monitor high-pressure high-temperature annealing of ion-implanted GaN films. Fall 99 electronic proceedings: symposium W GaN and related alloys (1999), Materials Research Society, Boston, MA 1 W11.46
    • (1999) Fall 99 electronic proceedings: symposium W GaN and related alloys , pp. 1
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.