Defect spectroscopy of nanodiamond thin layers

Diamond and Related Materials

Volumn 15, Issue 4-8, 2006, Pages 559-563

  Kravets, R ^a   Johnston, K ^a   Potmesil, J ^a   Vorlicek, V ^a   Vanecek, M ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Defect characterization; Diamond film; Electrical properties characterization; Nanocrystalline

Indexed keywords

FOURIER TRANSFORM INFRARED SPECTROSCOPY; GLASS; NANOSTRUCTURED MATERIALS; PHOTOCURRENTS; SILICON; SPECTROSCOPIC ANALYSIS;

DEFECT CHARACTERIZATION; ELECTRICAL PROPERTIES CHARACTERIZATION; NANOCRYSTALLINE DIAMOND; PHOTOCURRENT SPECTRUM;

DIAMOND FILMS;

EID: 33745236028     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2005.11.053     Document Type: Article

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