Minimize system failure rate considering variations of electronic components lifetime data

Proceeding of 2005 International Conference on Asian Green Electronics- Design for Manufacturability and Reliability, 2005AGEC

Volumn 2005, Issue , 2005, Pages 129-134

  Jin, Tongdan ^a,d   Xiong, Zhenhua ^b   Wang, Peng ^c  

^a TERADYNE INC   (United States)

^b SHANGHAI JIAO TONG UNIVERSITY   (China)

^c UNITED TECHNOLOGIES RESEARCH CENTER   (United States)

^d Digital Process Lab of Teradyne   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CENTRAL LIMIT THEOREM; ELECTRICAL STRESSES; NON-LINEAR INTEGER-PROGRAMMING; POWER CONSUMPTION; STOCHASTIC NUMBER;

APPROXIMATION THEORY; ELECTRICAL ENGINEERING; GENETIC ALGORITHMS; OPTIMIZATION; PRINTED CIRCUIT BOARDS; STOCHASTIC CONTROL SYSTEMS;

MICROELECTRONICS;

EID: 33744977899     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. B. Edson, X. Tian, A Prediction Based Design-For-Reliability Tool, Proceeding of Annual Reliability and Maintainability Symposium, January 2004.
2. Bellcore, Reliability Prediction Procedure for Electronic Equipment, SR-332, Issue 5, Dec 1995.
3. Feger, C. R., Strange, T. R. Life Testing of Aluminum Electrolytics and the End of Life Dilemma, http://www.ec-central.org/magazine/nov_dec_02/ tech_paper_lifetesting.pdf.
4. Reliasoft Corporation, Accelerated Life Testing Reference, from www.weibull.com.
5. Fenn Jason, Electronic Component Reliability, John Wiley & Sons, 1995.
6. Tongdan Jin, Peter Su, Estimate System Reliability Variability Based on Six-Sigma Criteria Considering Component Operational Uncertainties, RAMS 2005, January, 2005, Alexandria, VA.