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Volumn , Issue , 2004, Pages 412-417

A prediction based design-for-reliability tool

Author keywords

Design for Reliability; Prediction; System Reliability

Indexed keywords

DESIGN FOR RELIABILITY; PREDICTION; SYSTEM RELIABILITY; DESIGN ENGINEERS; DESIGN TRADEOFF; PREDICTION-BASED; RELIABILITY PREDICTION; SHORT PRODUCT; STRESS PREDICTION;

EID: 2342619492     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (7)

References (7)
  • 6
    • 84862343063 scopus 로고    scopus 로고
    • Semiconductor International
    • Zhang, Y., et al, Trends in Component Reliability and Testing, Semiconductor International, retrieved from http://www.semiconductor.net/ semiconductor/issues/issues/19 99/sep99/feature4.asp
    • Trends in Component Reliability and Testing
    • Zhang, Y.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.