Interface formation and structural properties of iron films on Al 0.48In0.52As(001)

Journal De Physique. IV : JP

Volumn 132, Issue , 2006, Pages 225-229

  Schieffer, P ^a   Tournerie, N ^a   Lepine B ^a   Lallaizon, C ^a   Guivarc'h, A ^a   Jezequel G ^a  

^a UNIVERSITÉ DE RENNES 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DIFFRACTION; EPITAXIAL GROWTH; IRON; THIN FILMS; ULTRAVIOLET SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

FILMS SURFACES; PHOTOEMISSION DATA; PINNING POSITIONS; STRUCTURAL PROPERTIES;

ALUMINUM;

EID: 33744951548     PISSN: 11554339     EISSN: 17647177     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:2006132043     Document Type: Conference Paper

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