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Volumn 16, Issue 6, 2006, Pages 1191-1205

Ultra-high resolution flat-panel volume CT: Fundamental principles, design architecture, and system characterization

Author keywords

CT; Dose; Flat panel detector; High resolution; Volume CT

Indexed keywords

SILICON DIOXIDE;

EID: 33744809303     PISSN: 09387994     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00330-006-0156-y     Document Type: Review
Times cited : (170)

References (16)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.