Thickness influence on surface morphology and ozone sensing properties of nanostructured ZnO transparent thin films grown by PLD

Applied Surface Science

Volumn 252, Issue 15, 2006, Pages 5351-5354

  Christoulakis, S ^a,b   Suchea, M ^a,b   Koudoumas, E ^c   Katharakis, M ^c   Katsarakis, N ^a,c   Kiriakidis, G ^a,b  

^a INSTITUTE OF ELECTRONIC STRUCTURE AND LASER   (Greece)

^b UNIVERSITY OF CRETE   (Greece)

^c TECHNOLOGICAL EDUCATIONAL INSTITUTE OF CRETE   (Greece)

Author keywords

AFM; Ozone; PLD; Zinc oxide

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEPOSITION; EXCIMER LASERS; FILM GROWTH; OZONE; SILICON; SURFACE TOPOGRAPHY; THIN FILMS; X RAY DIFFRACTION; ZINC OXIDE;

FILM DEPOSITION PARAMETERS; FILM ROUGHNESS; FILM THICKNESS; GRAIN SHAPE;

NANOSTRUCTURED MATERIALS;

EID: 33744795994     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.12.071     Document Type: Article

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